Structural and chemical characterization of Mn doped GaN nanowires by X-ray absorption spectroscopy

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 11, 2009, Pages 6772-6776

  Seong, Han Kyu ^a   Kim, Ungkil ^a   Kim, Myoung Ha ^a   Lee, Hyun Hwi ^b   Lee, Dong Ryeol ^b   Kim, Jae Young ^b   Choi, Heon Jin ^a  

^a Yonsei University   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Anomalous x ray scattering (axs); Diluted magnetic semiconductors (dmss); Mn:gan nanowire; X ray absorption spectroscopy (xas)

Indexed keywords

ANOMALOUS X-RAY SCATTERING; ANOMALOUS X-RAY SCATTERING (AXS); CHEMICAL CHARACTERIZATION; CHEMICAL STATE; DILUTED MAGNETIC SEMICONDUCTORS; DILUTED MAGNETIC SEMICONDUCTORS (DMSS); ELECTRONIC CONFIGURATION; LOCAL MAGNETIC MOMENTS; MN ATOMS; MN-DOPED GAN; MN:GAN NANOWIRE; WURTZITES; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION SPECTROSCOPY (XAS); X-RAY MAGNETIC CIRCULAR DICHROISM SPECTRA;

ABSORPTION; ATOMIC SPECTROSCOPY; ATOMS; DICHROISM; ELECTRIC WIRE; FERROMAGNETISM; GALLIUM ALLOYS; GALLIUM NITRIDE; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; MANGANESE; MANGANESE COMPOUNDS; NANOWIRES; SCATTERING; SEMICONDUCTING GALLIUM; SIPHONS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY SCATTERING; X RAYS; ZINC SULFIDE;

ABSORPTION SPECTROSCOPY;

EID: 70350309630     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.1368     Document Type: Article

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