Electrochemical deposition and characterization of Cd-Fe-Se thin films

Advanced Materials Research

Volumn 68, Issue , 2009, Pages 69-76

  Thanikaikarasan, S ^a   Mahalingam, T ^a   Sundaram, K ^a   Kim, Taekyu ^b   Kim, Yong Deak ^c   Velumani, S ^d  

^a ALAGAPPA UNIVERSITY   (India)

^b Security Management Institute   (South Korea)

^c Ajou University   (South Korea)

^d DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

Cadmium iron chalcogenides; Electrodeposition; Optical properties; X ray diffraction

Indexed keywords

CONDUCTING GLASS; DEPOSITED FILMS; DEPOSITION POTENTIAL; ELECTROCHEMICAL DEPOSITION; ELECTROLYTIC BATHS; ENERGY DISPERSIVE ANALYSIS; HEXAGONAL STRUCTURES; OPTICAL ABSORPTION TECHNIQUES; POTENTIOSTATIC ELECTRODEPOSITION; PREFERENTIAL ORIENTATION; SCANNING ELECTRON MICROSCOPES; SELENIDES;

CADMIUM; CATHODIC POLARIZATION; CHALCOGENIDES; DEPOSITION; DIFFRACTION; ELECTRODEPOSITION; HOLOGRAPHIC INTERFEROMETRY; OPTICAL PROPERTIES; OXIDE FILMS; REDUCTION; SCANNING ELECTRON MICROSCOPY; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; TIN; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

OPTICAL FILMS;

EID: 70350281294     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMR.68.69     Document Type: Conference Paper

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