Ac electrical properties and dielectric relaxation of the new mixed crystal (Na0.8Ag0.2)2PbP2O7

Journal of Alloys and Compounds

Volumn 486, Issue 1-2, 2009, Pages 299-303

  Louati, B ^a   Hlel, F ^a   Guidara, K ^a  

^a University of Sfax   (Tunisia)

Author keywords

(Na0.8Ag0.2)2PbP2O7; ac conductivity; Dielectric measurements; X ray diffraction

Indexed keywords

(NA0.8AG0.2)2PBP2O7; AC CONDUCTIVITY; AC ELECTRICAL PROPERTIES; DIELECTRIC MEASUREMENTS; DIPHOSPHATES; FREQUENCY EXPONENT; HIGH FREQUENCY; MIXED CRYSTALS; SPACE GROUPS; TRICLINIC SYMMETRY; UNIT CELL PARAMETERS;

CELL MEMBRANES; DIELECTRIC PROPERTIES; DIELECTRIC RELAXATION; DIFFRACTION; LEAD COMPOUNDS; SILVER; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SODIUM;

EID: 70350100478     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.06.148     Document Type: Article

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