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Volumn 45, Issue 9, 2009, Pages 35-38
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Bilayer metamaterial lens breaks the diffraction limit
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPIC MATERIAL;
ANISOTROPIC METAMATERIALS;
BI-LAYER;
DIFFRACTION LIMITS;
IMPEDANCE MATCH;
METAL INSULATORS;
METAMATERIAL LENS;
NANO INCLUSION;
OPERATING WAVELENGTH;
PERIODIC COMPOSITES;
PHASE BALANCE;
PHYSICAL PHENOMENA;
STRONG ANISOTROPY;
SUBWAVELENGTH IMAGING;
VISIBLE FREQUENCIES;
DIELECTRIC MATERIALS;
ELECTRONIC EQUIPMENT;
METAL INSULATOR BOUNDARIES;
METAMATERIALS;
OPTICAL ANISOTROPY;
OPTICAL INSTRUMENTS;
RESTORATION;
STRUCTURAL METALS;
STRUCTURE (COMPOSITION);
LENSES;
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EID: 70350072256
PISSN: 10438092
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (11)
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References (12)
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