Elemental characterization of impurities at trace and ultra-trace levels in metallurgical lead samples by INAA

Microchemical Journal

Volumn 93, Issue 2, 2009, Pages 188-194

  Capannesi, G ^a   Rosada, A ^a   Avino, P ^b  

^a ENEA   (Italy)

^b ISPESL   (Italy)

Author keywords

Anti Compton; Certification; INAA; Metallurgical lead; Radiochemical separation; Ultra trace impurities

Indexed keywords

EID: 70350068247     PISSN: 0026265X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microc.2009.07.004     Document Type: Article

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