Fabrication of silver decorated anodic aluminum oxide substrate and its optical properties on surface-enhanced Raman scattering and thin film interference

Langmuir

Volumn 25, Issue 19, 2009, Pages 11869-11873

  Ji, Nan ^a   Ruan, Weidong ^a   Wang, Mchunxu ^a   And, Zhicheng Lu ^a   Zhao, Bing ^a  

^a Jilin University   (China)

Author keywords

[No Author keywords available]

Indexed keywords

4-MERCAPTOPYRIDINE; AAO TEMPLATE; ABSORBANCES; AG NANOPARTICLE; ALTERNATING CURRENT; ANODIC ALUMINUM OXIDE; ANODIZATIONS; ELECTROCHEMICAL DEPOSITION; HIGH QUALITY; MIRROR REFLECTIONS; POROUS ANODIC ALUMINUM OXIDES; SERS SPECTRUM; SIMPLE METHOD; SURFACE PLASMA RESONANCES; SURFACE-ENHANCED RAMAN SCATTERING; THIN-FILM INTERFERENCE; THREE-DIMENSIONAL (3D) NANOSTRUCTURES;

ALUMINA; ALUMINUM; NANOPARTICLES; OPTICAL PROPERTIES; OXIDES; RAMAN SCATTERING; REDUCTION; SILVER; SURFACE PLASMON RESONANCE; SURFACES; THIN FILM DEVICES; THIN FILMS; THREE DIMENSIONAL;

SUBSTRATES;

ALUMINUM OXIDE; METAL NANOPARTICLE; SILVER;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODE; LIGHT RELATED PHENOMENA; POROSITY; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; ULTRAVIOLET SPECTROPHOTOMETRY;

ALUMINUM OXIDE; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODES; METAL NANOPARTICLES; MICROSCOPY, ELECTRON, SCANNING; OPTICAL PROCESSES; POROSITY; SILVER; SPECTROPHOTOMETRY, ULTRAVIOLET; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 70349932825     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la901521j     Document Type: Article

References (24)

1. Hering, K.; Cialla, D.; Ackermann, K.; Dorfer, T.; Moller, R.; Schneidewind, H.; Mattheis, R.; Fritzsche, W.; Rosch, P.; Popp, J. Anal. Bioanal. Chem. 2008, 390, 113.
2. Shah, N. C.; Lyandres, O.; Walsh, J. T.; Glucksberg, M. R.; Van Duyne, R. P. Anal. Chem. 2007, 79, 6927.
3. Tripp, R. A.; Dluhy, R. A.; Zhao, Y. P. Nano Today 2008, 3, 31.
4. Zhou, J.; Xu, S. P.; Xu, W. Q.; Zhao, B.; Ozaki, Y. J. Raman Spectrosc. 2009, 40, 31.
5. Hulteen, J. C.; Van Duyne, R. P. J. Vac. Sci. Technol., A 1995, 13, 1553.
6. Litorja, M.; Haynes, C. L.; Haes, A. J.; Jensen, T. R.; Van Duyne, R. P. J. Phys. Chem. B 2001, 105, 6907.
7. Dieringer, J. A.; McFarland, A. D.; Shah, N. C.; Stuart, D. A.; Whitney, A. V.; Yonzon, C. R.; Young, M. A.; Zhang, X. Y.; Van Duyne, R. P. Faraday Discuss. 2006, 132, 9.
8. Li, W. Y.; Camargo, P. H. C.; Lu, X. M.; Xia, Y. N. Nano Lett. 2009, 9, 485.
9. Ko, H.; Tsukruk, V. V. Small 2008, 4, 1980.
10. Lu, Z. C.; Ruan, W. D.; Yang, J. X.; Xu, W. Q.; Zhao, C.; Zhao, B. J. Raman Spectrosc. 2009, 40, 112.
11. Moon, J. M.; Wei, A. J. Phys. Chem. B 2005, 109, 23336.
12. Sauer, G.; Brehm, G.; Schneider, S.; Nielsch, K.; Wehrspohn, R. B.; Choi, J.; Hofmeister, H.; Gosele, U. J. Appl. Phys. 2002, 91, 3243.
13. Sauer, G.; Brehm, G.; Schneider, S.; Graener, H.; Seifert, G.; Nielsch, K.; Choi, J.; Goring, P.; Gosele, U.; Miclea, P.; Wehrspohn, R. B. J. Appl. Phys. 2005, 97, 024308.
14. Nielsch, K.; Muller, F.; Li, A. P.; Gosele, U. Adv. Mater. 2000, 12, 582.
15. Xu, D. S.; Chen, D. P.; Xu, Y. J.; Shi, X. S.; Guo, G. L.; Gui, L. L.; Tang, Y. Q. Pure Appl. Chem. 2000, 72, 127.
16. Zhang, C.; Smirnov, A. I.; Hahn, D.; Grebel, H. Chem. Phys. Lett. 2007, 440, 239.
17. Zhang, C.; Abdijalilov, K.; Grebel, H. J. Chem. Phys. 2007, 127, 044701.
18. Zhang, L.; Cho, H. S.; Li, F.; Metzger, R. M.; Doyle, W. D. J. Mater. Sci. Lett. 1998, 17, 291.
19. Sharma, G.; Pishko, M. V.; Grimes, C. A. J. Mater. Sci. 2007, 42, 4738.
20. Gerein, N. J.; Haber, J. A. J. Phys. Chem. B 2005, 109, 17372.
21. Hu, J. W.; Zhao, B.; Xu, W. Q.; Li, B. F.; Fan, Y. G. Spectrochim. Acta, Part A 2002, 58, 2827.
22. Yang, C. J.; Liang, S. W.; Wu, P. W.; Chen, C.; Shieh, J. M. Electrochem. Solid-State Lett. 2007, 10, C69.
23. Ru, E. C. L.; Blackie, E.; Meyer, M.; Etchegoin, P. G. J. Phys. Chem. C 2007, 111, 13794.
24. Song, W.; Wang, Y. X.; Zhao, B. J. Phys. Chem. C 2007, 111, 12786.