Surface-enhanced Raman scattering detected temperature programmed desorption: Optical properties, nanostructure, and stability of silver film over SiO2 nanosphere surfaces

Journal of Physical Chemistry B

Volumn 105, Issue 29, 2001, Pages 6907-6915

  Litorja, Maritoni ^a,b   Haynes, Christy L ^a   Haes, Amanda J ^a   Jensen, Traci R ^a,c   Van Duyne, Richard P ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Omega Optical Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILVER FILMS;

ADSORPTION; ANNEALING; DESORPTION; MAGNETOELECTRIC EFFECTS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; NATURAL FREQUENCIES; RAMAN SCATTERING; THERMODYNAMIC STABILITY; ULTRAHIGH VACUUM; ULTRAVIOLET RADIATION;

SILVER;

EID: 0035954947     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp010333y     Document Type: Article

References (57)

1. Weaver, M.J.; Zou, S. Vibrational Spectroscopy of Electrochemical Interfaces: Some Walls and Bridges to Surface Science Understanding. In Spectroscopy for Surface Science; Clark, R.J.H., FRS, Hester, R.E., Eds.; John Wiley & Sons: New York, 1998; Vol. 26; pp 219-272.
2. Campion, A.; Kambhampati, P. Chem. Soc. Rev. 1998, 27, 241-250.
3. Otto, A.; Mrozek, I.; Grabhorn, H.; Akemann, W. J. Phys. Condens. Matter 1992, 4, 1143-1212.
4. Cotton, T.M.; Brandt, E.S. Surface-Enhanced Raman Scattering. In Physical Methods of Chemistry, Series: Investigations of Surfaces and Interfaces - Part B, 2nd ed.; Rossiter, B.W., Baetzold, R.C., Eds.; John Wiley & Sons: New York, 1993; Vol. IXB.; pp 633-718.
5. Moskovits, M. Rev. Mod. Phys. 1985, 57, 783-826.
6. Weaver, M.J. J. Phys. Chem. 1996, 100, 13 079-13 089.
7. Nabiev, I.; Chourpa, I.; Maufait, M. J. Raman Spectrosc. 1994, 25, 13-23.
8. Fabian, H.; Anzenbacher, P. Vib. Spectrosc. 1993, 4, 125-148.
9. Douketis, C.; Haslett, T.L.; Wang, Z.; Moskovits, M.; Iannotta, S. Prog. Surf. Sci. 1995, 50, 187-195.
10. Van Duyne, R.P.; Haller, K.L.; Altkorn, R.I. Chem. Phys. Lett. 1986, 126, 190-196.
11. Kneipp, K.; Kueipp, H.; Itzkan, I.; Dasari, R.R.; Feld, M.S. Chem. Rev. 1999, 99, 2957-2975.
12. Hildebrandt, P.; Stockburger, M. J. Phys. Chem. 1984, 88, 5935-5944.
13. Schatz, G.C. Electromagnetic Mechanism of Surface Enhanced Spectroscopy. In Fundamentals and Applications of Surface Raman Spectroscopy; Garrell, R.L., Pemberton, J.E., Cotton, T.M., Eds.; VCH Publishers: Deerfield Beach, Florida, 1997.
14. Kambhampati, P.; Child, C.M.; Foster, M.C.; Campion, A. J. Chem. Phys. 1998, 108, 5013-5026.
15. Michaels, A.M.; Nirmal, M.; Brus, L.E. J. Am. Chem. Soc. 1999, 121, 9932-9939.
16. Emory, S.R.; Haskins, W.E.; Nie, S. J. Am. Chem. Soc. 1998, 120, 8009-8010.
17. Michaels, A.M.; Jiang, J.; Brus, L. J. Phys. Chem. B 2000, 104 (50), 11965-11971.
18. Smardzewski, R.R.; Colton, R.J.; Murday, J.S. Chem. Phys. Lett. 1979, 68, 53-57.
19. Eesley, G.L.; Smith, J.R. Solid State Commun. 1979, 31, 815-819.
20. Rowe, J.E.; Shank, C.V.; Zwemer, D.A.; Murray, C.A. Phys. Rev. Lett. 1980, 44, 1770-1773.
21. Wood, T.H.; Zwemer, D.A.; Shank, C.V.; Rowe, J.E. Chem. Phys. Lett. 1981, 82, 5-8.
22. Sanda, P.N.; Demuth, J.E.; Tsang, J.C.; Warlaumont, J.M. Coverage Dependence. In Surface Enhanced Raman Scattering; Chang, R.K., Furtak, T.E., Eds.; Plenum Press: New York, 1982; pp 189-202.
23. Tsang, J.C.; Kirtley, J.R.; Theis, T.N. J. Chem. Phys. 1982, 77, 641-645.
24. Seki, H. J. Vac. Sci. Technol. 1981, 18, 633-637.
25. Seki, H. J. Chem. Phys. 1982, 76, 4412-4418.
26. Seki, H.; Philpott, M.R. J. Chem. Phys. 1980, 73, 5376-5379.
27. Mrozek, I.; Pettenkofer, C.; Otto, A. Surf. Sci. 1990, 238, 192-198.
28. Royer, P.; Goudonnet, J.P.; Warmack, R.J.; Ferrell, T.L. Phys. Rev. B 1987, 35, 3753-3759.
29. Roark, S.E.; Rowlen, K.L. Chem. Phys. Lett. 1993, 212, 50-56.
30. Van Duyne, R.P.; Hulteen, J.C.; Treichel, D.A. J. Chem. Phys. 1993, 99, 2101-2115.
31. Norrod, K.L.; Rowlen, K.L. Anal. Chem. 1998, 70, 4218-4221.
32. Seki, H.; Chuang, T.J. Solid State Commun. 1982, 44, 473-475.
33. Pockrand, I.; Otto, A. Solid State Commun. 1981, 38, 1159-1163.
34. Wood, T.H.; Klein, M.V.; Zwemer, D.A. Surf. Sci. 1981, 107, 625-635.
35. Pockrand, I.; Otto, A. Solid State Commun. 1980, 35, 861-865.
36. Wood, T.H.; Klein, M.V. Solid State Commun. 1980, 35, 263-265.
37. Donketis, C.; Wang, Z.; Haslett, T.L.; Moskovits, M. Phys. Rev. B 1995, 51, 11022-11031.
38. Reed, C.E.; Giergiel, J.; Ushioda, S.; Hemminger, J.C. Phys. Rev. B 1985, 31, 1873-1880.
39. Zou, S.; Weaver, M.J.; Li, X.Q.; Ren, B.; Tian, Z.Q. J. Phys. Chem. B 1999, 103, 4218-4222.
40. Luo, H.; Weaver, M.J. Langmuir 1999, 15, 8743-8749.
41. Zou, S.; Williams, C.T.; Chen, E.K.-Y.; Weaver, M.J. J. Am. Chem. Soc. 1998, 120, 3811-3812.
42. Zou, S.; Weaver, M.J. Anal. Chem. 1998, 70, 2387-2395.
43. Williams, C.T.; Takoudis, C.G.; Weaver, M.J. J. Phys. Chem. B 1998, 102, 406-416.
44. Zou, S.; Gomez, R.; Weaver, M.J. Langmuir 1997, 13, 6713-6721.
45. Liao, P.F.; Bergman, J.G.; Chemla, D.S.; Wokaun, A.; Melngailis, J.; Hawryluk, A.M.; Economou, N.P. Chem. Phys. Lett. 1981, 81, 355-359.
46. Hulteen, J.C.; Van Duyne, R.P. J. Vac. Sci. Tech. A 1995, 13, 1553-1558.
47. Hallmark, V.M.; Campion, A. Chem. Phys. Lett. 1984, 110, 561-564.
48. Wolkow, R.A.; Moskovits, M. J. Chem. Phys. 1986, 84, 5196-5199.
49. Haq, S.; King, D.A. J. Phys. Chem. 1996, 100, 16 957-16 965.
50. 60. Ph.D. Thesis, Northwestern University, 1996.
51. Litorja, M.; Van Duyne, R.P. J. Phys. Chem. B, in preparation.
52. Mullins, D.R.; Campion, A. Chem. Phys. Lett. 1984, 110, 565-570.
53. Pockrand, I. Chem. Phys. Lett. 1982, 92, 514-518.
54. Akers, K.I.; Cousins, L.M.; Moskovits, M. Chem. Phys. Lett. 1992, 190, 614-620.
55. Zhang, Y.; Edens, G.; Weaver, M.J. J. Am. Chem. Soc. 1991, 113, 9395-9397.
56. Caldwell, W.B.; Chen, K.; Herr, B.R.; Mirkin, C.A.; Hulteen, J.C.; Van Duyne, R.P. Langmuir 1994, 10, 4109-4115.
57. Kelemen, S.R.; Wachs, I.E. Surf. Sci. 1980, 97, L370-L374.