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Applied Physics Letters

Volumn 95, Issue 14, 2009, Pages

Magnetostriction-driven cantilevers for dynamic atomic force microscopy

(5) Penedo, M a Fernandez Martinez I a Costa Kramer J L a Luna, M a Briones, F a

a INSTITUTO DE MICROELECTRÓNICA DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATED STRESS; DIMENSIONAL CHANGES; DYNAMIC ATOMIC FORCE MICROSCOPY; EXCELLENT CORROSION RESISTANCES; HIGH RESOLUTION; LIQUID ENVIRONMENT; LOW NOISE; MECHANICAL EXCITATIONS; MECHANICAL OSCILLATIONS; SOFT MAGNETIC PROPERTIES; TOPOGRAPHIC IMAGES;

ATOMIC FORCE MICROSCOPY; CHEMICAL STABILITY; CORROSION RESISTANCE; LIQUIDS; MAGNETIC PROPERTIES; MAGNETOSTRICTION; MAGNETOSTRICTIVE DEVICES; NANOCANTILEVERS; THIN FILMS;

AMORPHOUS FILMS;

EID: 70349902327 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3237180 Document Type: Article

Times cited : (9)

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