Planar differential interferometry of the magnetic field measurements

Journal De Physique. IV : JP

Volumn 129, Issue , 2005, Pages 169-172

  Tyszkiewicz, C ^a   Pustelny, T ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; INTERFEROMETRY; QUANTUM OPTICS; REFRACTIVE INDEX;

PLANAR DIFFERENTIAL INTERFEROMETRY; PROPAGATION CONSTANT;

MAGNETIC FIELDS;

EID: 33645058681     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2005129036     Document Type: Conference Paper

References (8)

1. Lukosz W. and Stamm Gh., Sensors and Actuators B 11 (1993) 177-181.
2. Lukosz W., Sensors and Actuators B 29 (1995) 37-50.
3. Gut K., Blahut M., Rogozinski R., Opilski Z. and Opilski A., Proc of SPIE 3058 (1997) 137-144.
4. Brochard F. and Gennes de P.G., J. Phys. 31 (1970) 691.
5. Burylov S.V. and Raikher Yu.L., Mol. Cryst. Liquid Cryst. 258 (1995) 107-122.
6. Chen S.H. and Amer N.M., Phys. Rev. Lett. 51 (1983) 2298.
7. Burylov S.V. and Raikher Yu.L., Mol. Cryst. Liquid Cryst. 258 (1995) 123-141.
8. Tyszkiewicz C. and Pustelny T., Optica Applicata 34 (4) (2004) 507-514.