Topological properties of hydrogen bonds and covalent bonds from charge densities obtained by the maximum entropy method (MEM)

Acta Crystallographica Section B: Structural Science

Volumn 65, Issue 5, 2009, Pages 624-638

  Netzel, Jeanette ^a   Van Smaalen, Sander ^a  

^a UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOND CRITICAL POINTS; CHEMICAL BONDINGS; DYNAMIC DEFORMATION; ELECTRON DENSITIES; H-BONDS; HIGH RESOLUTION; HYDROGEN BONDINGS; ISOTROPIC DISPLACEMENT; KINETIC ENERGY DENSITY; LOW TEMPERATURES; MAXIMUM ENTROPY METHODS; MULTIPOLES; OXFORD UNIVERSITY; STATIC AND DYNAMIC; TOPOLOGICAL PROPERTIES; X-RAY DIFFRACTION DATA;

AMINES; AMINO ACIDS; ATOMS; BINDING SITES; BOND LENGTH; COVALENT BONDS; DEFORMATION; EQUATIONS OF STATE; HYDROGEN; ORGANIC ACIDS; TOPOLOGY; X RAY DIFFRACTION;

HYDROGEN BONDS;

AMINO ACID;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ENTROPY; HYDROGEN BOND; TEMPERATURE; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

AMINO ACIDS; CRYSTALLOGRAPHY, X-RAY; ELECTROCHEMISTRY; ENTROPY; HYDROGEN BONDING; TEMPERATURE; X-RAY DIFFRACTION;

EID: 70349599827     PISSN: 01087681     EISSN: 01087681     Source Type: Journal    
DOI: 10.1107/S0108768109026767     Document Type: Article

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