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Volumn 135, Issue 10, 2009, Pages 1089-1099

Stochastic modeling of deterioration processes through dynamic bayesian networks

Author keywords

Bayesian analysis; Cracking; Deterioration; Fatigue; Inspection; Markov process; Monitoring; Stochastic processes

Indexed keywords

BAYESIAN ANALYSIS; BAYESIAN UPDATING; COMPUTATIONALLY EFFICIENT; CRACKING; DETERIORATION PROCESS; DYNAMIC BAYESIAN NETWORK; FATIGUE; FATIGUE CRACK GROWTH; GENERIC FRAMEWORKS; INTEGRITY MANAGEMENT; NEAR-REAL TIME; ON DYNAMICS; PROBABILISTIC MODELING; ROBUST RELIABILITY; STOCHASTIC MODELING; STOCHASTIC PROCESSES;

EID: 70349556022     PISSN: 07339399     EISSN: None     Source Type: Journal    
DOI: 10.1061/(ASCE)EM.1943-7889.0000024     Document Type: Article
Times cited : (209)

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