SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 255, Issue 24, 2009, Pages 9779-9782

XRD and XPS analysis of laser treated vanadium oxide thin films

(5) Beke, S a,b Korosi L c Papp, S c Oszko A c Nanai L c

a AIX MARSEILLE UNIVERSITÉ (France)

b UNIVERSITY OF SZEGED (Hungary)

c UNIVERSITY OF SZEGED (Hungary)

Author keywords

Laser radiation; Sol gel process; Vanadium oxide thin films; X ray photoelectron spectroscopy

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LASER RADIATION; OXIDE FILMS; OXIDES; PHOTOELECTRONS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM PENTOXIDE; X RAY DIFFRACTION ANALYSIS; XEROGELS;

LASER INTENSITIES; LASER TREATED; ORTHORHOMBIC STRUCTURES; POLYCRYSTALLINE; STRUCTURE CHANGE; VANADIUM OXIDE THIN FILMS; VANADIUM OXIDES; XPS ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 70349442555 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2009.04.069 Document Type: Article

Times cited : (43)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.