Atomistic computation of local stress and strain distribution around an InAs quantum dot between a GaAs capping layer and a substrate

Electronic Materials Letters

Volumn 4, Issue 3, 2008, Pages 107-111

  Do, Eun Cheol ^a   Lee, Byeong Joo ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Atomistic simulation; InAs GaAs quantum dots; MEAM; Strain stress distribution

Indexed keywords

EID: 70349427315     PISSN: 17388090     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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