SCOPUS 정보 검색 플랫폼

Volumn 6, Issue 5, 2009, Pages 1067-1069

Characterization of proton irradiated AgInSe2 thin film

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION METHOD; GRAIN SIZE; INTERSTITIAL HYDROGEN; PROTON ENERGY; QUARTZ GLASS SUBSTRATES; SECONDARY PHASIS; XRD SPECTRA;

CARRIER CONCENTRATION; HYDROGEN; LATTICE CONSTANTS; OXIDE MINERALS; QUARTZ; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS;

PROTONS;

EID: 70349413410 PISSN: 18626351 EISSN: None Source Type: Journal
DOI: 10.1002/pssc.200881139 Document Type: Conference Paper

Times cited : (7)

References (6)

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2
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- Imaizumi, M.¹ Sumita, T.² Kawakita, S.³ Aoyama, K.⁴ An-zawa, O.⁵ Aburaya, T.⁶ Hisamatsu, T.⁷ Maysuda, S.⁸

3
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- (1972) J. Appl. Phys , vol.43 , pp. 2469
- Tell, B.¹ Shary, J.T.² Kasper, H.M.³

4
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- P. P. Ramesh, O. M. Hussain, S. Utjanna, B. S. Naidu, and P. J. Reddy, Mater. Lett. 34, 27 (1997).
- (1997) Mater. Lett , vol.34 , pp. 27
- Ramesh, P.P.¹ Hussain, O.M.² Utjanna, S.³ Naidu, B.S.⁴ Reddy, P.J.⁵

5
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- H. Matsuo, K. Yoshino, and T. Ikari, Phys. Status Solidi C 3, 2644 (2006).
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