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Volumn 15, Issue 4, 2009, Pages 1128-1131

Investigation of efficiency droop behaviors of InGaN/GaN multiple-quantum-well LEDs with various well thicknesses

Author keywords

Efficiency droop; InGaN GaN; LED; Multiple quantum well (MQW)

Indexed keywords

ACTIVE REGIONS; AUGER RECOMBINATION; DOMINANT MECHANISM; EXTERNAL QUANTUM EFFICIENCY; HIGH CURRENT DENSITIES; INGAN/GAN; LED; MULTIPLE QUANTUM WELL (MQW); MULTIPLE QUANTUM WELLS; SIMULATION RESULT; WELL STRUCTURE;

EID: 70349303384     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2009.2015894     Document Type: Article
Times cited : (33)

References (12)
  • 1
    • 0029346154 scopus 로고
    • High-brightness InGaN blue, green and yellow light-emitting diodes with quantum well structures
    • S. Nakamura, M. Senoh, N. Iwasa, and S. Nagahama, "High-brightness InGaN blue, green and yellow light-emitting diodes with quantum well structures," Jpn. J. Appl. Phys, vol.67, pp. L797-L799, 1995.
    • (1995) Jpn. J. Appl. Phys , vol.67
    • Nakamura, S.1    Senoh, M.2    Iwasa, N.3    Nagahama, S.4
  • 3
    • 33645533436 scopus 로고    scopus 로고
    • GaInN light-emitting diode with conductive omnidirectional reflector having a low-refractive-index indium-tin oxide layer
    • J. K. Kim, T. Gessmann, E. F. Schubert, J.-Q. Xi, H. Luo, J. Cho, C. Sone, and Y. Park, "GaInN light-emitting diode with conductive omnidirectional reflector having a low-refractive-index indium-tin oxide layer," Appl. Phys. Lett., vol.88, no.1, pp. 13501-13503, 2006.
    • (2006) Appl. Phys. Lett. , vol.88 , Issue.1 , pp. 13501-13503
    • Kim, J.K.1    Gessmann, T.2    Schubert, E.F.3    Xi, J.-Q.4    Luo, H.5    Cho, J.6    Sone, C.7    Park, Y.8
  • 4
    • 0001597513 scopus 로고    scopus 로고
    • Low-resistance ohmic contacts to p-type GaN
    • Y.-L. Li, E. F. Schubert, and J. W. Graff, "Low-resistance ohmic contacts to p-type GaN," Appl. Phys. Lett., vol.76, no.19, pp. 2728-2730, 2000.
    • (2000) Appl. Phys. Lett. , vol.76 , Issue.19 , pp. 2728-2730
    • Li, Y.-L.1    Schubert, E.F.2    Graff, J.W.3
  • 5
    • 36849016286 scopus 로고    scopus 로고
    • Effect of dislocation density on efficiency droop in GaInN/GaN light-emitting diodes
    • M. F. Schubert, S. Chhaied, J. K. Kim, E. F. Schubert, and J. W. Graff, "Effect of dislocation density on efficiency droop in GaInN/GaN light-emitting diodes," Appl. Phys. Lett., vol.91, no.23, pp. 231114-231116, 2007.
    • (2007) Appl. Phys. Lett. , vol.91 , Issue.23 , pp. 231114-231116
    • Schubert, M.F.1    Chhaied, S.2    Kim, J.K.3    Schubert, E.F.4    Graff, J.W.5
  • 9
    • 35648940727 scopus 로고    scopus 로고
    • Efficiency droop behaviors of InGaN/GaN multiple-quantum-well light-emitting diodes with varying quantum well thickness
    • Y.-L. Li, Y.-R. Huang, and Y.-H. Lai, "Efficiency droop behaviors of InGaN/GaN multiple-quantum-well light-emitting diodes with varying quantum well thickness," Appl. Phys. Lett., vol.91, no.18, pp. 181113-181115, 2007.
    • (2007) Appl. Phys. Lett. , vol.91 , Issue.18 , pp. 181113-181115
    • Li, Y.-L.1    Huang, Y.-R.2    Lai, Y.-H.3
  • 11
    • 0000674108 scopus 로고    scopus 로고
    • Influence of the quantum-well thickness on the radiative recombination of InGaN/GaN quantum well structures
    • J. Bai, T. Wang, and S. Sakai, "Influence of the quantum-well thickness on the radiative recombination of InGaN/GaN quantum well structures," J. Appl. Phys., vol.88, no.8, pp. 4729-4733, 2000.
    • (2000) J. Appl. Phys. , vol.88 , Issue.8 , pp. 4729-4733
    • Bai, J.1    Wang, T.2    Sakai, S.3
  • 12
    • 0032477178 scopus 로고    scopus 로고
    • Structural and optical emission characteristics of InGaN thin layers and the implications for growing high-quality quantum wells by MOCVD
    • J. T. Kobayashi, N. P. Kobayashi, X. Zhang, P. D. Dapkus, and D. H. Rich, "Structural and optical emission characteristics of InGaN thin layers and the implications for growing high-quality quantum wells by MOCVD," J. Crystal Growth, vol.195, pp. 252-257, 1998.
    • (1998) J. Crystal Growth , vol.195 , pp. 252-257
    • Kobayashi, J.T.1    Kobayashi, N.P.2    Zhang, X.3    Dapkus, P.D.4    Rich, D.H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.