A neural network forecasting model for consumable parts in semiconductor manufacturing

Journal of Manufacturing Technology Management

Volumn 20, Issue 3, 2009, Pages 404-412

  Jou, Yung Tsan ^a   Wee, Hui Ming ^a   Chen, Hsiao Ching ^a   Hsieh, Yao Hung ^a   Wang, Laurence ^a  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

Forecasting; Maintenance; Manufacturing systems; Neural nets; Taiwan

Indexed keywords

BACK PROPAGATION NEURAL NETWORKS; DESIGN/METHODOLOGY/APPROACH; FORECAST MODEL; FORECASTING MODELS; FUNDAMENTAL CONCEPTS; HIDDEN LAYERS; INITIAL VALUES; MANAGEMENT PROBLEMS; MANUFACTURING PROCESS; MANUFACTURING SYSTEMS; NEURAL NETS; NEURAL NETWORK ANALYSIS; NEURAL NETWORK FORECAST; NEURAL NETWORK LEARNING; PROBE CARDS; PRODUCTION DATA; RESEARCH SUPPORT; SEMI-CONDUCTOR WAFER; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR MANUFACTURING; SIMULATION MODEL; TAIWAN;

ELECTRIC NETWORK ANALYSIS; ELECTRON DEVICE TESTING; FORECASTING; INDUSTRIAL APPLICATIONS; INDUSTRIAL ENGINEERING; INDUSTRIAL RESEARCH; MANUFACTURE; PROBES; PROCESS ENGINEERING; REPAIR; SEMICONDUCTOR DEVICE MANUFACTURE;

NEURAL NETWORKS;

EID: 70349199759     PISSN: 1741038X     EISSN: None     Source Type: Journal    
DOI: 10.1108/17410380910936828     Document Type: Article

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