Selective detection of phosgene by nanocrystalline diamond layer

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 9, 2009, Pages 2070-2073

  Davydova, Marina ^a,b   Kromka, Alexander ^a   Exnar, Petr ^c   Stuchlik, Martin ^d   Hruska, Karel ^a   Vanecek, Milan ^a   Kalbac, Martin ^e  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^c TECHNICAL UNIVERSITY OF LIBEREC   (Czech Republic)

^d UNIVERSITY OF PARDUBICE   (Czech Republic)

^e J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION TIME; GAS SENSING PROPERTIES; HIGH TEMPERATURE; HUMID AIR; IMPEDANCE MEASUREMENT; MICROWAVE PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION; NANOCRYSTALLINE DIAMOND FILMS; NANOCRYSTALLINE DIAMOND LAYERS; REDUCING GAS; SELECTIVE DETECTION; SEM; SURFACE CONDUCTIVITY;

DIAMOND FILMS; ELECTRIC CONDUCTIVITY; MICROWAVES; NANOCRYSTALLINE MATERIALS; PLASMA DEPOSITION; SCANNING ELECTRON MICROSCOPY;

PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

EID: 70349124590     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200982216     Document Type: Article

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