Complex interrupted tetrahedral frameworks in the nitridosilicates M 7Si6N15(M = La, Ce, Pr)

Chemistry - A European Journal

Volumn 15, Issue 36, 2009, Pages 9215-9222

  Schmolke, Christian ^a   Oeckler, Oliver ^a   Bichler, Daniel ^a   Johrendt, Dirk ^a   Schnick, Wolfgang ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

Electron microscopy; Magnetic properties; Nitridosilicates; Structure elucidation; X ray diffraction

Indexed keywords

AVERAGE STRUCTURE; DIIMIDE; DISORDERED CRYSTALLITES; DISORDERED CRYSTALS; FINITE CHAINS; HIGH RESOLUTION; ISOSTRUCTURAL; MAGNETIC SUSCEPTIBILITY MEASUREMENTS; METAL NITRIDES; NEW STRUCTURES; NITRIDOSILICATES; PARAMAGNETIC BEHAVIOR; POWDER DIFFRACTION; RADIO FREQUENCIES; RECIPROCAL SPACE; RHOMBOHEDRAL CRYSTALS; RING SIZES; SINGLE CRYSTAL X-RAY DIFFRACTION; STRUCTURAL MOTIFS; STRUCTURE ELUCIDATION; SUPERSTRUCTURE REFLECTIONS; TETRAHEDRAL FRAMEWORK; THREE-DIMENSIONAL NETWORKS; TRANSMISSION ELECTRON MICROGRAPH;

CERIUM; CERIUM COMPOUNDS; CRYSTALLITES; CRYSTALS; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; LANTHANUM; MAGNETIC MOMENTS; MAGNETIC SUSCEPTIBILITY; SILICON; SILICON NITRIDE; TWINNING; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL STRUCTURE;

EID: 70349115663     PISSN: 09476539     EISSN: 15213765     Source Type: Journal    
DOI: 10.1002/chem.200900703     Document Type: Article

References (32)

1. F. Liebau, Structural Chemistry of Silicates, Springer, Berlin, 1985.
2. H. Huppertz, W. Schnick, Chem. Eur. J. 1997, 3, 249.
3. H. A. Hoppe, F. Stadler, O. Oeckler, W. Schnick, Angew. Chem. 2004, 116, 5656;
4. Angew. Chem. Int. Ed. 2004, 43, 5540.
5. O. Oeckler, F. Stadler, T. Rosenthal, W. Schnick, Solid State Sci. 2007, 9, 205.
6. F. Stadler, O. Oeckler, H. A. Hoppe, M. H. Möller, R. Pöttgen, B. D. Mosel, P. Schmidt, V. Duppel, A. Simon, W. Schnick, Chem. Eur. J. 2006, 12, 6984.
7. R. Mueller-Mach, G. Mueller, M. R. Krames, H. A. Hoppe, F. Stadler, W. Schnick, T. Juestel, P. Schmidt, Phys. Status Solidi a 2005, 202, 1727.
8. V. Bachmann, C. Ronda, O. Oeckler, W. Schnick, A. Meijerink, Chem. Mater. 2009, 21, 316.
9. X-RED 32, Data Reduction for STADI 4 and IPDS, Version 1.03, STOE & Cie GmbH, Darmstadt, 2002.
10. X-Shape, Crystal Optimization for Numerical Absorption Correction, Version 1.05, STOE & Cie GmbH, Darmstadt, 1999.
11. XPREP-Reciprocal space exploration, Version 6.12, Bruker-AXS, 2001
12. T. Schlieper, W. Schnick, Z. Anorg. Allg. Chem. 1995, 621, 1535.
13. M. Woike, W. Jeitschko, Z. Kristallogr. 1996, 211, 813.
14. R. D. Shannon, Acta Crystallogr. Sect. A 1976, 32, 751.
15. W. H. Baur, Crystallogr. Rev. 1987, 1, 59.
16. P. Stadelmann, Ultramicroscopy 1987, 21,131.
17. G. Chollon, R. Hany, U. Vogt, K. Berroth, J. Eur. Ceram. Soc. 1998, 18, 535.
18. T. Schlieper, W. Milius, W. Schnick, Z. Anorg. Allg. Chem. 1995, 621, 1380.
19. O. Oeckler, F. Stadler, T. Rosenthal, W. Schnick, Solid State Sci. 2007, 9, 205.
20. H. Lueken, Magnetochemie, Teubner, Stuttgart, 1999.
21. H. Huppertz, W. Schnick, Angew. Chem. 1997, 109, 2765;
22. Angew. Chem. Int. Ed. Engl. 1997, 36, 2651
23. S. Pagano, O. Oeckler, T. Schröder, W. Schnick, Eur. J. Inorg. Chem. 2009, 2678.
24. G. O. Brunner, W. O. Meier, Nature 1989, 337, 146.
25. H. Lange, G. Wötting, G. Winter, Angew. Chem. 1991, 103, 1606;
26. Angew. Chem. Int. Ed. Engl. 1991, 30, 1579.
27. W. Schnick, H. Huppertz, R. Lauterbach, J. Mater. Chem. 1999, 9, 289.
28. J. Farrugia, J. Appl. Crystallogr. 1999, 32, 837.
29. G. M. Sheldrick, Acta Crystallogr. Sect.. A 1997, 64,112.
30. WinXPOW, Version 2.12. STOE & Cie GmbH Darmstadt, 2005
31. B. H. Toby, J. Appl. Crystallogr. 2001, 34, 210.
32. A.C. Larson, R.B. Von Dreele Los Alamos, Natl. Lab. [Rep.] LA (US) 2000, 86.