|
Volumn 42, Issue 11, 2009, Pages
|
Structural and optical properties of RF-sputtered ZnFe2O 4 thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AFM IMAGE;
ARGON ENVIRONMENT;
BAND GAPS;
DISPERSION PARAMETERS;
ENERGY BANDGAPS;
ENVELOPE METHOD;
GAS PRESSURES;
GLASS SUBSTRATES;
NANOCRYSTALLINES;
PURE OXYGEN;
RF-MAGNETRON SPUTTERING;
RF-POWER;
ROOM TEMPERATURE;
SPINEL STRUCTURE;
STRUCTURAL AND OPTICAL PROPERTIES;
TRANSMISSION SPECTRUMS;
WEMPLE-DIDOMENICO MODEL;
XRD;
ZINC FERRITE;
ARGON;
DISPERSION (WAVES);
ENERGY GAP;
LIGHT REFRACTION;
LIGHT TRANSMISSION;
NANOCRYSTALLINE MATERIALS;
OPTICAL CONSTANTS;
ORGANIC POLYMERS;
OXYGEN;
REFRACTIVE INDEX;
REFRACTOMETERS;
THIN FILMS;
ZINC;
ZINC COMPOUNDS;
OPTICAL FILMS;
|
EID: 70249111184
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/11/115306 Document Type: Article |
Times cited : (54)
|
References (26)
|