Electrical characterization of screen-printed conductive circuit with silver nanopaste

Japanese Journal of Applied Physics

Volumn 48, Issue 6 PART 2, 2009, Pages

  Kim, Jong Woong ^a   Jung, Seung Boo ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AFTER-HEAT TREATMENT; AG NANOPARTICLE; DIRECT CURRENT; ELECTRICAL CHARACTERISTIC; ELECTRICAL CHARACTERIZATION; ELECTRICAL LOSS; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPES; FREQUENCY RANGES; HIGH TEMPERATURE; NETWORK ANALYZER; PRINTED PATTERNS; PROBE SYSTEMS; QUARTZ WAFERS; S-PARAMETERS; SCREEN-PRINTED; SINTERING CONDITION; SINTERING TEMPERATURES; THICKNESS PROFILES;

ELECTRIC NETWORK ANALYSIS; LOSS PREVENTION; MICROSTRUCTURE; OXIDE MINERALS; POLYMER BLENDS; QUARTZ; SCANNING ELECTRON MICROSCOPY; SCATTERING PARAMETERS; SILVER;

SINTERING;

EID: 70249107802     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJaP.48.06FD141     Document Type: Article

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