A novel method for measurement of electronic work function of micro/nanostructure materials using a Kelvin probe system

Philosophical Magazine Letters

Volumn 89, Issue 9, 2009, Pages 557-564

  Li, W ^a   Wu, C W ^a   Ke, L M ^a   Yang, C G ^a   Wei, P ^a   Zhu, S F ^a  

^a NANCHANG HANGKONG UNIVERSITY   (China)

Author keywords

Electronic; Kelvin probe; Micro nanostructure; Nanoceramics; Work function; ZnO nanorods

Indexed keywords

ELECTRONIC; KELVIN PROBE; MICRO/NANOSTRUCTURE; NANOCERAMICS; ZNO NANORODS;

NANORODS; PROBES; SEMICONDUCTING ZINC COMPOUNDS; WORK FUNCTION; ZINC OXIDE;

SUBSTRATES;

EID: 70249102123     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830903170559     Document Type: Article

References (12)

1. I. Brodiel and C.A. Spindt, Adv. Electr. El. Phys. 83 (1992) p.10.
2. S.S. Li, Semiconductor Physical Electronics, 2nd ed., Spring Science, & Business Media, New York, 2006.
3. J.S. Kim, B. Lä gel, E. Moons, N. Johansson, I.D. Baikie, W.R. Salaneck, R.H. Friend and F. Cacialli, Synth. Met. 111 (2000) p.311.
4. X.D. Bai, E.G. Wang, P.X. Gao and Z.L. Wang, Nano Lett. 3.8 (2003) p.1147.
5. M. Mazzer, K.W.J. Barnham, I.M. Ballard, A. Bessiere, A. Ionnides, D.C. Johnson, M.C. Lynch, T.N.D. Tibbits, J.S. Roberts, G. Hills and C. Calder, Thin Solid Films 511 (2006) p.76.
6. M. Law, L.E. Greene, J.C. Johnson, R. Saykally and P.D. Yang, Nat. Mater 4 (2005) p.455.
7. D.C. Look, J. Electr. Mater. 35 (2006) p.1290.
8. W. Li, M. Cai, Z. Zong and S. Yu, Appl. Phys. Lett. 88 (2006) p.181902.
9. J. Chen, W. Lei, W.Q. Chai, Z.C. Zhang, C. Li and X.B. Zhang, Solid State Electr. 52 (2008) p.294.
10. I.D. Baikie, P.J.S. Smith, D.M. Porterfield and P.J. Estrup, Rev. Sci. Instrum. 70 (1999) p.1842.
11. Manual Version SKP 4.5, KP Technology Ltd. Available at www.kptechnology.ltd.uk
12. S.L. Ding, J. Guo, X.H. Yan, K. Xuan and T.J. Lin, Mater. Rev. 19 (2005) p.74.