SCOPUS 정보 검색 플랫폼

Volumn 87, Issue 9 II, 2000, Pages 5690-5692

Measurement of stacking fault densities in CoCrPt thin film media using grazing incidence x-ray scattering

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004007509 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.372491 Document Type: Article

Times cited : (12)

References (7)

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2
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- (1995) IEEE Trans. Magn. , vol.31 , pp. 2833
- Nakai, J.¹ Kikuchi, A.² Sakurai, T.³ Shimatsu, T.⁴ Takahashi, M.⁵

3
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- C. Gao, S. Wu, J.-P. Chen, R. Malmhall, C. Habermeier, R. Sinclair, H. Laidler, and K. O'Grady, IEEE Trans. Magn. 34, 1576 (1998).
- (1998) IEEE Trans. Magn. , vol.34 , pp. 1576
- Gao, C.¹ Wu, S.² Chen, J.-P.³ Malmhall, R.⁴ Habermeier, C.⁵ Sinclair, R.⁶ Laidler, H.⁷ O'Grady, K.⁸

4
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- P. Dova, H. Laidler, K. O'Grady, M. F. Toney, and M. F. Doerner, J. Appl. Phys. 85, 2775 (1999).
- (1999) J. Appl. Phys. , vol.85 , pp. 2775
- Dova, P.¹ Laidler, H.² O'Grady, K.³ Toney, M.F.⁴ Doerner, M.F.⁵

5
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- K. O'Grady, N. S. Walmsley, C. F. Wood, and R. W. Chantrell, IEEE Trans. Magn. 34, 1579 (1998).
- (1998) IEEE Trans. Magn. , vol.34 , pp. 1579
- O'Grady, K.¹ Walmsley, N.S.² Wood, C.F.³ Chantrell, R.W.⁴

6
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- L. Holloway and H. Laidler (in preparation)
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7
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- Dover, New York
- B. E. Warren, X-ray Diffraction (Dover, New York, 1990).
- (1990) X-ray Diffraction
- Warren, B.E.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.