3D imaging of Si and Er Nanoclusters in Er Doped SiO1.5 films by STEM tomography

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 1256-1257

  Li, P ^a   Wang, X ^a,b   Malac, M ^a,b   Egerton, R ^a,b   Meldrum, A ^b   Lenz, F ^b   Liang, X ^b   Wang, J ^a,c  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF ALBERTA   (Canada)

^c CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949186253     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093143     Document Type: Article

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