Characterization of an annular four-channel silicon drift detector with a light element window

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 206-207

  Terborg, R ^a   Rohde, M ^a  

^a BRUKER AXS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949172094     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094276     Document Type: Article

References (3)

1. A. Niculae et al., Microsc. Microanal. 13 (Suppl.2) (2007), 1430
2. R. Terborg, M. Rohde, Microsc. Microanal. 14 (Suppl.2) (2008), 1166
3. P. Kotula et al., Microsc. Microanal. 14 (Suppl.2) (2008), 116