Advances in the technology of silicon drift detectors (SDD) and multiple element SDD

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1166-1167

  Terborg, R ^a   Rohde, M ^a  

^a BRUKER AXS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549092011     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608081968     Document Type: Conference Paper

References (3)

1. R. Terborg, M. Rohde, Microsc. Microanal. 10 (Suppl.2) (2004), 942
2. A. Niculae et al., Microsc. Microanal. 13 (Suppl.2) (2007), 1430
3. P. Kotula et al., Australian Conf. Microsc. Microanal. 20 (2008), to be published