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Volumn , Issue , 2008, Pages 401-404

An improved perception-based no-reference objective image sharpness metric using iterative edge refinement

Author keywords

Edge detection; HVS; Image quality; Objective; Perception; Sharpness metric

Indexed keywords

BLURRED IMAGE; EDGE PIXELS; HVS; IMAGE SHARPNESS; NO REFERENCES; OBJECTIVE; OBJECTIVE METRICS; PERCEIVED SHARPNESS; PERCEPTION; PREDICTION ACCURACY; REFINEMENT ALGORITHMS; SHARPNESS METRIC;

EID: 69949165047     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2008.4711776     Document Type: Conference Paper
Times cited : (58)

References (13)
  • 2
    • 48149094784 scopus 로고    scopus 로고
    • A no-reference objective image sharpness metric based on Just Noticeable Blur and Probability Summation
    • R. Ferzli and L. J. Karam, "A no-reference objective image sharpness metric based on Just Noticeable Blur and Probability Summation," in IEEE International Conference on Image Processing, vol. 3, pp. 445-448, 2007.
    • (2007) IEEE International Conference on Image Processing , vol.3 , pp. 445-448
    • Ferzli, R.1    Karam, L.J.2
  • 3
    • 84873875126 scopus 로고    scopus 로고
    • Ong. E, Lin. W, Lu. Z, Yang. X, Yao. S, Pan.F, Jiang, L. and Moschetti, F, A no-reference quality metric for measuring image blur, in Proceedings of the IEEE International Signal Processing and Its Applications, 1, pp. 469-472, 2003.
    • Ong. E, Lin. W, Lu. Z, Yang. X, Yao. S, Pan.F, Jiang, L. and Moschetti, F, "A no-reference quality metric for measuring image blur," in Proceedings of the IEEE International Signal Processing and Its Applications, vol. 1, pp. 469-472, 2003.
  • 5
    • 34247181955 scopus 로고    scopus 로고
    • The Fast Multilevel Fuzzy Edge Detection of Blurry Images
    • J. Wu, Z. P. Yin, and Y. Xiong, "The Fast Multilevel Fuzzy Edge Detection of Blurry Images," IEEE Signal Processing Letters, Volume 14, Issue 5, pp. 344-347, 2007.
    • (2007) IEEE Signal Processing Letters , vol.14 , Issue.5 , pp. 344-347
    • Wu, J.1    Yin, Z.P.2    Xiong, Y.3
  • 6
    • 0019962960 scopus 로고
    • An automatic focusing and astigmatism correction system for the SEM and CTEM
    • S.J. Erasmus and K.C.A. Smith, "An automatic focusing and astigmatism correction system for the SEM and CTEM," Journal of Microscopy, no. 127, pp. 185-199, 1982.
    • (1982) Journal of Microscopy , Issue.127 , pp. 185-199
    • Erasmus, S.J.1    Smith, K.C.A.2
  • 7
    • 33644493977 scopus 로고    scopus 로고
    • Autofocusing and astigmatism correction in the scanning electron microscope,
    • MPhil Thesis, University of Cambridge
    • C. F. Batten, "Autofocusing and astigmatism correction in the scanning electron microscope," MPhil Thesis, University of Cambridge, 2000.
    • (2000)
    • Batten, C.F.1
  • 8
    • 0026024074 scopus 로고
    • Comparison of autofocus methods for automated microscopy
    • L. Firestone, K. Cook, N. Talsania, and K. Preston, "Comparison of autofocus methods for automated microscopy," Cytometry, vol. 12, pp. 195-206, 1991
    • (1991) Cytometry , vol.12 , pp. 195-206
    • Firestone, L.1    Cook, K.2    Talsania, N.3    Preston, K.4
  • 10
    • 0346280002 scopus 로고    scopus 로고
    • A new sharpness metric based on local kurtosis, edge and energy information
    • J. Caviedes and F. Oberti, "A new sharpness metric based on local kurtosis, edge and energy information," Signal processing: Image Communication, vol. 19, no. 2, pp. 147-161, 2004.
    • (2004) Signal processing: Image Communication , vol.19 , Issue.2 , pp. 147-161
    • Caviedes, J.1    Oberti, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.