Optical, structural and electrical properties of the new absorber Sn2Sb2S5 thin films

Chalcogenide Letters

Volumn 6, Issue 4, 2009, Pages 163-170

  Gassoumi, A ^a   Kanzari, M ^a  

^a UNIVERSITY OF TUNIS EL MANAR   (Tunisia)

Author keywords

Optical properties; Sn2Sb2S5; Surface morphology; Thin films; X ray diffraction

Indexed keywords

EID: 69949156114     PISSN: 15848663     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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