Study of atomic force microscopy probes using a local electrode atom probe microscope

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 290-291

  Tourek, C J ^a   Sundararajan, S ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949153146     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094434     Document Type: Article

References (3)

1. P. M. Williams et al., J. Vac. Sci. Technol. B. 14(2) (1996) 1557.
2. M. K. Miller, Atom Probe Tomography, Plenum, New York, 2000.
3. This research was supported by a grant from the W. M Keck Foundation and Iowa State University