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Volumn 484, Issue 1-2, 2009, Pages 356-359
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Study of ceramic materials in the SrSnO3-NaNbO3 system by X-ray diffraction, dielectric and Raman spectroscopy
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Author keywords
Ceramic; Dielectric; Ferroelectric; Raman and X ray diffraction; Relaxor
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Indexed keywords
CERAMIC MATERIALS;
DIELECTRIC MATERIALS;
FERROELECTRIC MATERIALS;
FERROELECTRICITY;
PERMITTIVITY;
RAMAN SPECTROSCOPY;
CERAMIC;
CHEMICAL COMPOSITIONS;
COMPOSITION RANGES;
DIELECTRIC PERMITTIVITIES;
FERROELECTRIC RELAXORS;
RELAXORS;
TEMPERATURE RANGE;
TETRAGONAL PHASIS;
X RAY DIFFRACTION;
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EID: 69949097352
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.04.097 Document Type: Article |
Times cited : (19)
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References (24)
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