Extended X-ray absorption fine structure of copper(II) complexes at the air-water interface by a polarized total-reflection X-ray absorption technique

Analytical Sciences

Volumn 25, Issue 4, 2009, Pages 475-480

  Nagatani, Hirohisa ^a   Tanida, Hajime ^b   Watanabe, Iwao ^c   Sagara, Takamasa ^a  

^a NAGASAKI UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; AIR; ATOMIC PHYSICS; COPPER ALLOYS; ELECTROMAGNETIC WAVE REFLECTION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; METAL COMPLEXES; MOLECULAR ORIENTATION; PHASE INTERFACES; POLARIZATION; WATER ABSORPTION; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

AIR WATER INTERFACES; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; LOCAL COORDINATION STRUCTURES; POLARIZATION DEPENDENCE; POLARIZATION PLANES; VERTICAL POLARIZATION; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION NEAR-EDGE STRUCTURE;

COPPER COMPOUNDS;

EID: 69849099196     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.25.475     Document Type: Article

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