REX2000: Yet another XAFS analysis package

Physica Scripta T

Volumn T115, Issue , 2005, Pages 205-206

  Taguchi, T ^a   Ozawa, T ^a   Yashiro, H ^a  

^a RIGAKU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; MULTIPLE SCATTERING; USER INTERFACES; WINDOWS OPERATING SYSTEM; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

GRAPHICS WINDOWS; USER FRIENDLY INTERFACES;

SOFTWARE PACKAGES;

EID: 33645738982     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00205     Document Type: Article

References (14)

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3. Teo B K 1986 EXAFS: Basic Principles and Data Analysis (Springer Verlag, New York)
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14. 2000 Error Reporting Recommendations: A Report of the Standards and Criteria Committee electronic publication on the web site of IXS