Time-resolved X-ray spectroscopic imaging with novel silicon drift detectors

IEEE Transactions on Nuclear Science

Volumn 53, Issue 1, 2006, Pages 373-377

  Castoldi, A ^a,b,c   Galimberti, A ^a,b,c   Guazzoni, C ^a,b,c   Struder L ^d,e  

^a IEEE   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c INFN SEZIONE DI MILANO   (Italy)

^d MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^e MPI HALBLEITERLABOR   (Germany)

Author keywords

2 D and 3 D tomography; Controlled drift detector; Fast readout; High resolution energy resolved X ray imaging; Silicon drift detector; Time resolved X ray imaging; X ray spectroscopy

Indexed keywords

2-D AND 3-D TOMOGRAPHY; CONTROLLED-DRIFT DETECTOR; FAST READOUT; HIGH-RESOLUTION ENERGY-RESOLVED X-RAY IMAGING; SILICON DRIFT DETECTOR; TIME-RESOLVED X-RAY IMAGING; X-RAY SPECTROSCOPY;

CHARGE COUPLED DEVICES; DETECTORS; RADIOGRAPHY; TOMOGRAPHY; X RAY SPECTROSCOPY;

IMAGING TECHNIQUES;

EID: 33645684263     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.869845     Document Type: Article

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