|
Volumn , Issue , 2003, Pages 104-106
|
Planar inductors with subdivided conductors for reducing eddy current effects
|
Author keywords
CMOS process; Conductors; Eddy currents; Inductors; Magnetic fields; Measurement standards; Q factor; Scattering parameters; Silicon; Spirals
|
Indexed keywords
BANDPASS FILTERS;
CMOS INTEGRATED CIRCUITS;
EDDY CURRENTS;
ELECTRIC CONDUCTORS;
ELECTRIC INDUCTORS;
INTEGRATED CIRCUITS;
MAGNETIC FIELDS;
Q FACTOR MEASUREMENT;
SCATTERING PARAMETERS;
SILICON;
CMOS PROCESSS;
EDDY-CURRENT EFFECTS;
MEASUREMENT STANDARDS;
METAL LAYER;
PLANAR INDUCTOR;
Q-FACTORS;
QUALITY FACTORS;
SPIRALS;
MONOLITHIC INTEGRATED CIRCUITS;
|
EID: 69749116436
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SMIC.2003.1196680 Document Type: Conference Paper |
Times cited : (4)
|
References (6)
|