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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 6, 2009, Pages 969-972

Study on the behavior of oxygen atoms in swift heavy ion irradiated CeO2 by means of synchrotron radiation X-ray photoelectron spectroscopy

(7) Iwase, A a Ohno, H a Ishikawa, N b Baba, Y b Hirao, N b Sonoda, T c Kinoshita, M c

a Osaka Prefecture University (Japan)

b JAPAN ATOMIC ENERGY AGENCY (Japan)

c CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY (Japan)

Author keywords

Ce valence state; CeO2; Electronic excitation effect; Oxygen atom displacements; Swift heavy ion irradiation; XPS measurements

Indexed keywords

CE VALENCE STATE; CEO2; ELECTRONIC EXCITATION EFFECT; OXYGEN ATOM DISPLACEMENTS; SWIFT HEAVY ION IRRADIATION; XPS MEASUREMENTS;

ATOMIC SPECTROSCOPY; ATOMS; CERIUM; CERIUM COMPOUNDS; HEAVY IONS; IRRADIATION; OXYGEN; PELLETIZING; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; XENON;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 69749109168 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2009.02.035 Document Type: Article

Times cited : (41)

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