Automated monitoring to reduce electron microscope downtime

Ultramicroscopy

Volumn 109, Issue 11, 2009, Pages 1389-1392

  Brunner, Matthias J ^a   Resch, Guenter P ^a  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

Author keywords

Downtime; Monitoring; Transmission electron microscope; Uptime

Indexed keywords

AUTOMATED MONITORING; COUPLING CONSTANTS; DOWNTIME; SENSITIVE INSTRUMENTS; TRANSMISSION ELECTRON MICROSCOPE; UPTIME; USER ACCESS;

COMPUTER SOFTWARE; ELECTRONS; LIGHT TRANSMISSION; MAINTENANCE; OPERATING COSTS; SEMICONDUCTOR QUANTUM WIRES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON MICROSCOPES;

ARTICLE; AUTOMATION; COMPUTER NETWORK; COMPUTER PROGRAM; COMPUTER SYSTEM; COST EFFECTIVENESS ANALYSIS; ELECTRON MICROSCOPE; INTERNET; MONITORING; TELECOMMUNICATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 69749105353     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.07.003     Document Type: Article

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