Microsystem technology based diode lasers and Raman sensors for in situ food quality control

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7315, Issue , 2009, Pages

  Sumpf, B ^a   Schmidt, H ^b   Maiwald, M ^a   Muller A ^a   Erbert, G ^b   Kronfeldt, H D ^a   Trankle G ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

External cavity diode laser; Food quality control; Microsystem technology; Raman sensor

Indexed keywords

CCD DETECTORS; DIODE LASERS; EXCITATION LASERS; EXTERNAL CAVITY DIODE LASER; FOOD CONTROL; FOOD QUALITY; FOOD QUALITY CONTROL; HANDHELD LASER SCANNERS; IN-SITU; IN-SITU CONTROL; LASER DEVICE; LONGISSIMUS; MICRO-OPTICAL BENCH; MICRO-SYSTEM TECHNOLOGIES; MICROSYSTEM TECHNOLOGY; OPTICAL BENCH; OUTPUT POWER; POLYCHROMATORS; RAMAN MEASUREMENTS; RAMAN PROBE; RAMAN SENSOR; RAMAN SENSORS; SOLID SAMPLES; SPECTRAL ANALYSIS; SPECTRAL WIDTHS; STABLE EMISSIONS;

AGRICULTURE; DIODES; FIBER OPTIC SENSORS; FOOD SUPPLY; LASER EXCITATION; LASERS; LIGHT TRANSMISSION; MICROSYSTEMS; PROBES; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; RAMAN SPECTROSCOPY; SENSORS; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; TOTAL QUALITY MANAGEMENT;

QUALITY CONTROL;

EID: 69649099052     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.817912     Document Type: Conference Paper

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