Self-diffusion and defect annihilation in nanocrystalline Fe films probed by neutron reflectometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 1, 2009, Pages

  Chakravarty, Sujoy ^a   Schmidt, Harald ^a   Tietze, Ursula ^b   Lott, Dieter ^b   Lalla, N P ^c   Gupta, Ajay ^c  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b INSTITUTE OF MATERIALS RESEARCH   (Germany)

^c UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69549126220     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.014111     Document Type: Article

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