Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip

Journal of Physics: Conference Series

Volumn 100, Issue PART 5, 2008, Pages

  Brown, E ^a   Hao, L ^a   Cox, D C ^a   Gallop, J C ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY TRANSFER; NANOELECTRONICS; NANOTECHNOLOGY; SUBSTRATES;

ELECTRICAL IMAGING; LATERAL RESOLUTION; NANOELECTRONIC DEVICES; SCANNING PROBE TECHNIQUES; SCANNING TECHNIQUES; SCANNING THERMAL MICROSCOPY; THERMAL AND ELECTRICAL PROPERTIES; THERMAL TRANSPORT;

SCANNING;

EID: 69549106306     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/100/5/052012     Document Type: Conference Paper

References (5)

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4. Mills G, Zhou H, Midha A, Donaldson L and Weaver J MR 1998 Appl. Phys. Lett. 72 2900
5. Dobson P S, Mills G and Weaver J M R 2005 Rev. Sci. Instrum. 76 054901