SCOPUS 정보 검색 플랫폼

Volumn 76, Issue 5, 2005, Pages

Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers

(3) Dobson, P S a Mills, G a Weaver, J M R b

a Kelvin Nanotechnology Ltd (United Kingdom)

b UNIVERSITY OF GLASGOW (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

JOHNSON NOISE; MONOLITHIC AMPLIFIERS; SENSOR DEVICES; THERMAL RESISTOR NOISE;

ATOMIC FORCE MICROSCOPY; CALIBRATION; ELECTRON BEAM LITHOGRAPHY; MICROMACHINING; RESISTORS; SEMICONDUCTOR DEVICES; SENSORS; SIGNAL PROCESSING; SPURIOUS SIGNAL NOISE; THERMOCOUPLES;

THERMOMETERS;

EID: 18744377719 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1899463 Document Type: Article

Times cited : (30)

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