SCOPUS 정보 검색 플랫폼

Volumn 95, Issue 8, 2009, Pages

The correlation between electron density and anchoring strength in the inorganic vertical alignment layer

(7) Hwang, Byoung Har a Yoo, Young Bum a Oh, Jin Young a Chae, Soo Sang a Baik, Hong Koo a Lee, Se Jong b Song, Kie Moon c

a Yonsei University (South Korea)

b Kyungsung University (South Korea)

c Konkuk University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNMENT LAYERS; ANCHORING STRENGTH; ELECTRON DENSITIES; EXPERIMENTAL APPROACHES; LIQUID CRYSTAL ALIGNMENT; LOWER DENSITY; VERTICAL ALIGNMENT; VERTICAL ALIGNMENT LAYER; X-RAY REFLECTIVITY MEASUREMENTS;

LIGHT SOURCES; LIQUID CRYSTALS; SILICON COMPOUNDS; SILICON OXIDES; THIN FILMS;

ALIGNMENT;

EID: 69549091894 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3211117 Document Type: Article

Times cited : (1)

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