DNA deformations near charged surfaces: Electron and atomic force microscopy views

Biophysical Journal

Volumn 97, Issue 4, 2009, Pages 1148-1157

  Faas, F G A ^a   Rieger, B ^a   Van Vliet, L J ^a   Cherny, D I ^b,c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF LEICESTER   (United Kingdom)

^c INSTITUTE OF MOLECULAR GENETICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE STRANDED DNA;

ARTICLE; ATOMIC FORCE MICROSCOPY; DNA DAMAGE; DNA DETERMINATION; DNA EXTRACTION; ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 69449096970     PISSN: 00063495     EISSN: 15420086     Source Type: Journal    
DOI: 10.1016/j.bpj.2009.06.015     Document Type: Article

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