Electrochemical properties of negative SiMox electrodes deposited on a roughened substrate for rechargeable lithium batteries

Journal of Power Sources

Volumn 194, Issue 2, 2009, Pages 1061-1067

  Hwang, Chang Mook ^a   Lim, Chae Ho ^a   Yang, Jae Hoon ^a   Park, Jong Wan ^a  

^a Hanyang University   (South Korea)

Author keywords

Rechargeable lithium batteries, Negative electrode (anode); Roughened substrate; Silicon based alloy; SiMo

Indexed keywords

ALLOY ELECTRODES; ALLOY MATERIALS; CU FOIL; CYCLING TESTS; DISCHARGE CAPACITIES; ELECTROCHEMICAL TEST; EX SITU; FEW-CYCLE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HIGH CAPACITY; LITHIUM-ION BATTERY; NEGATIVE ELECTRODE; RECHARGEABLE LITHIUM BATTERIES, NEGATIVE ELECTRODE (ANODE); RECHARGEABLE LITHIUM BATTERY; RF-MAGNETRON SPUTTERING; ROUGHENED SUBSTRATE; SI ELECTRODES; SILICON BASED ALLOY; SIMO; VOLUME EXPANSION; X- RAY DIFFRACTION;

ELECTRIC DISCHARGES; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROCHEMICAL PROPERTIES; LITHIUM; LITHIUM ALLOYS; LITHIUM BATTERIES; LITHIUM COMPOUNDS; METAL CLADDING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON ALLOYS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL ELECTRODES;

EID: 69449088236     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2009.05.047     Document Type: Article

References (28)

1. Yoshio M., Wand H., Fukuda K., Umeno T., Dimov N., and Ogumi Z. J. Electrochem. Soc. 149 (2002) A1598
2. Limthongkul P., Jang Y.I., Dudney N.J., and Ching Y.M. Acta Mater. 5 (2003) 11103
3. Li H., Huang X., Chen L., Wu Z., and Liang Y. Electrochem. Solid State Lett. 2 (2003) 165
4. Wen Z.S., Yang J., Wang B.F., Wang K., and Liu Y. Electrochem. Commun. 5 (2003) 165
5. Chen Z., Christensen L., and Dahn J.R. Electrochem. Commun. 5 (2003) 919
6. Liu Y., Hanai K., Horikawa K., Imanishi N., Hirano A., and Takeda Y. Mater. Chem. Phys. 89 (2005) 80
7. Kim H., Choi J., Sohn H.J., and Kang T. J. Electrochem. Soc. 146 (1999) 4401
8. Lee K.-L., Jung J.-Y., Lee S.-W., Moon H.-S., and Park J.-W. J. Power Sources 130 (2004) 241
9. Moffat W.G. Handbook of Binary Phase Diagrams (1990), Genium Publishing Co., Schnectady, NY
10. Takao N., Tanaka I., and Adachi H. Intermetallics 4 (1996) S113
11. Hanshmoto Y., Machida N., and Shigematsu T. Solid State Ionics 175 (2004) 177
12. Hanai K., Liu Y., Imanishi N., Hirano A., Matsumura M., Ichikawa T., and Takeda Y. J. Power Sources 146 (2005) 156
13. Park M.-S., Lee Y.-J., Rajendran S., Song M.-S., Kim H.-S., and Lee J.-Y. Electrochim. Acta 50 (2005) 5561
14. Ahn J.-K., and Yoon S.-G. Electrochim. Acta 50 (2004) 371
15. Ishihara T., Nakasu M., Yoshio M., Nishiguchi H., and Takita Y. J. Power Sources 146 (2005) 161
16. Birkholz M., Selle B., Fuhs W., Chrestiansen S., Strunk H.P., and Reich R. Phys. Rev. B 64 (2001) 085402
17. Srinivas G., and Vankar V.D. Mater. Lett. 30 (1997) 209-215
18. Motooka T., and Holland O.W. Appl. Phys. Lett. 58 (1991) 2360
19. Weydanz W.J., Mehrens M.W., and Huggins R.A. J. Power Sources 81-82 (1999) 237
20. Li H., Huang X., Chen L., Wu Z., and Liang Y. Electrochem. Solid-State Lett. 2 (1999) 547
21. Fleischauer M.D., Topple J.M., and Dahn J.R. J. Electrochem. Soc. 8 (2005) A137
22. Moulder J.F., Strickle W.F., Sobol P.E., and Bomben K.D. Handbook of X-ray Photoelectron Spectroscopy (1992), Perkin-Elmer Co., Minnesota p. 54
23. Rastogi R.S., Vankar V.D., and Chopra K.L. J. Vac. Sci. Technol. A 10 (1992) 2822
24. Kurganskii S.I., Pereslavtseva N.S., Levitskaya E.V., and Yurakov Yu.A. Phys. Stat. Sol. (b) 233 2 (2002) 306-311
25. Herranen M., Bauer A.D., Carlsson J.O., and Bunshah R.F. Surf. Coat. Technol. 96 (1997) 245-254
26. The MEMS material database, in: J.F. Shackelford, W. Alexander (Eds.), CRC Materials Science and Engineering Handbook, 3rd edition, 2000, p. 567.
27. In: Lide D.R. (Ed). CRC Handbook of Chemistry and Physics. 81st edition (2000), CRC Press, Boca Raton, FL 12-46
28. L.A. Hall, Survey of Electrical Resistivity Measurements on 16 Pure Metals in the Temperature Range 0 to 273K, NBS Technical Note 365, U.S. Superintendent of Documents, 1968.