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Altomare, A.1
Burla, M.C.2
Camalli, M.3
Cascarano, M.4
Giacovazzo, C.5
Guagliardi, A.6
Polidori, G.7
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note
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54 graphically facilitated by Insight II from Ryoka Systems Inc. on Silicon Graphics Octane, was used.
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Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Gill, P. M. W.; Johnson, B G.; Robb, M. A.; Cheeseman, J. R.; Keith, T.; Petersson, G. A. Montgomery, J. A.; Raghavachari, K.; Al-Laham, M. A.; Zakrzewski, V. G.; Ortiz, J. V.; Foresman, J. B.; Cioslowski, J.; Stefanov, B. B. Nanayakkara, A.; Challacombe, M.; Peng, C. Y.; Ayala, P. Y.; Chen, W. Wong, M. W.; Andres, J. L.; Replogle, E. S.; Gomperts, R.; Martin, R. L. Fox, D. J.; Binkley, J. S.; Defrees, D. J.; Baker, J.; Stewart, J. P.; HeadGordon, M.; Gonzalez, C.; Pople, J. A. Gaussian, Inc., Pittsburgh, PA, 1995
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Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Gill, P. M. W.; Johnson, B G.; Robb, M. A.; Cheeseman, J. R.; Keith, T.; Petersson, G. A. Montgomery, J. A.; Raghavachari, K.; Al-Laham, M. A.; Zakrzewski, V. G.; Ortiz, J. V.; Foresman, J. B.; Cioslowski, J.; Stefanov, B. B. Nanayakkara, A.; Challacombe, M.; Peng, C. Y.; Ayala, P. Y.; Chen, W. Wong, M. W.; Andres, J. L.; Replogle, E. S.; Gomperts, R.; Martin, R. L. Fox, D. J.; Binkley, J. S.; Defrees, D. J.; Baker, J.; Stewart, J. P.; HeadGordon, M.; Gonzalez, C.; Pople, J. A. Gaussian, Inc., Pittsburgh, PA, 1995.
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