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2
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0003795535
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Eliel, E. L.; Wilen, S. H., Eds.; John Wiley & Sons
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For recent reviews, see: (a) Dodziuk, H. In Topics in Stereochemistry, Vol. 21; Eliel, E. L.; Wilen, S. H., Eds.; John Wiley & Sons, 1994.
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Topics in Stereochemistry
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Dodziuk, H.1
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4
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0033613730
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Sakamoto, Y.; Kumagai, T.; Matohara, K.; Lim, C.; Shinmyozu, T. Tetrahedron Lett. 1999, 40, 919-922.
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(1999)
Tetrahedron Lett.
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, pp. 919-922
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Sakamoto, Y.1
Kumagai, T.2
Matohara, K.3
Lim, C.4
Shinmyozu, T.5
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6
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0030470747
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(a) Sakamoto, Y.; Miyoshi, N.; Hirakida, M.; Kusumoto, S.; Kawase, H.; Rudzinsky, J. M.; Shinmyozu, T. J. Am. Chem. Soc. 1996, 118, 12267-12275.
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J. Am. Chem. Soc.
, vol.118
, pp. 12267-12275
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Sakamoto, Y.1
Miyoshi, N.2
Hirakida, M.3
Kusumoto, S.4
Kawase, H.5
Rudzinsky, J.M.6
Shinmyozu, T.7
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8
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0032792773
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Sentou, W.; Satou, T.; Yasutake, M.; Lim, C.; Shinmyozu, T. Eur. J. Org. Chem. 1999, 1223-1231.
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Sentou, W.1
Satou, T.2
Yasutake, M.3
Lim, C.4
Shinmyozu, T.5
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9
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85069281979
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note
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2O: C, 79.74%; H, 9.20%. Found: C, 79.34%; H, 8.85%.
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10
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85069276140
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note
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-1 (Rigaku RAXIS-IV imaging plate), 2321 reflections with I>3.00(I), R (Rw)=0.046 (0.032). Crystallographic data (excluding structure factor) for structure reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as Supplementary Publication no. CCDC-119350. Copies of the data can be obtained free of charge upon application to CCDC, 12 Union Road, Cambridge CB21EZ, UK (fax: (+44)-1223-33603; e-mail: deposit@ccdc.cam.ac.uk).
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11
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85069278822
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Gaussian, Inc.: Pittsburgh PA, graphically facilitated by Insight II from Ryoka Systems, Inc., on Silicon Graphics Octane, was used
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The computations were performed with ab initio MO calculations, and the Gaussian 94 program (see: Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Gill, P. M. W.; Johnson, B. G.; Robb, M. A.; Cheeseman, J. R.; Keith, T.; Petersson, G. A.; Montgomery, J. A.; Raghavachari, K.; Al-Laham, M. A.; Zakrzewski, V. G.; Ortiz, J. V.; Foresman, J. B.; Cioslowski, J.; Stefanov, B. B.; Nanayakkara, A.; Challacombe, M.; Peng, C. Y.; Ayala, P. Y.; Chen, W.; Wong, M. W.; Andres, J. L.; Replogle, E. S.; Gomperts, R.; Martin, R. L.; Fox, D. J.; Binkley, J. S.; Defrees, D. J.; Baker, J.; Stewart, J. P.; Head-Gordon, M.; Gonzalez, C.; Pople, J. A. Gaussian, Inc.: Pittsburgh PA, 1995) graphically facilitated by Insight II from Ryoka Systems, Inc., on Silicon Graphics Octane, was used.
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(1995)
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Frisch, M.J.1
Trucks, G.W.2
Schlegel, H.B.3
Gill, P.M.W.4
Johnson, B.G.5
Robb, M.A.6
Cheeseman, J.R.7
Keith, T.8
Petersson, G.A.9
Montgomery, J.A.10
Raghavachari, K.11
Al-Laham, M.A.12
Zakrzewski, V.G.13
Ortiz, J.V.14
Foresman, J.B.15
Cioslowski, J.16
Stefanov, B.B.17
Nanayakkara, A.18
Challacombe, M.19
Peng, C.Y.20
Ayala, P.Y.21
Chen, W.22
Wong, M.W.23
Andres, J.L.24
Replogle, E.S.25
Gomperts, R.26
Martin, R.L.27
Fox, D.J.28
Binkley, J.S.29
Defrees, D.J.30
Baker, J.31
Stewart, J.P.32
Head-Gordon, M.33
Gonzalez, C.34
Pople, J.A.35
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