Characterization of transmission-type curved-crystal X-ray optics for fast ion-beam spectroscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 400, Issue 1, 1997, Pages 137-148

  Beyer, Heinrich F ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

Fast beam spectroscopy; Monte Carlo simulation; Ray tracing; X ray optics; X ray spectroscopy

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; ION BEAMS; MONTE CARLO METHODS;

FAST BEAM SPECTROSCOPY; RAY TRACING; X RAY OPTICS;

X RAY SPECTROMETERS;

EID: 0031274904     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)01007-3     Document Type: Article

References (18)

1. H.F. Beyer, D. Liesen, Nucl. Instr. Meth. A 272 (1988) 895.
2. H.F. Beyer, P. Indelicato, K.D. Finlayson, D. Liesen, R.D. Deslattes, Phys. Rev. A 43 (1991) 223.
3. E. Förster, G. Hölzer, I. Uschmann, O. Wehrhan, G. Borchert, P. Indelicato, H.J. Besch, A.H. Walenta, H.W. Schenk, R.D. Deslattes, J. Schweppe, D. McCammon, F.v. Feilitzsch, R.L. Kelley, S.H. Moseley, C.K. Stahle, A. Simionovici, H.F. Beyer, F. Bosch, P. Egelhof, A. Gallus, J. Gildemeister, H.-J. Kluge, U. Kopf, D. Liesen, G. Menzel, J. Meier, M. Steck, Th. Stöhlker, Precision X-ray spectroscopy in one- and two-electron heavy ions, Technical Proposal, GSI Darmstadt, 1996.
4. P. Penning, D. Polder, Philips Res. Rep. 16 (1961) 419.
5. F. Balibar, F.N. Chukhovskii, C. Malgrange, Acta Crystallogr. A 39 (1983) 387.
6. C. Schulze, D. Chapman, Rev. Sci. Instr. 66 (1994) 2220.
7. G. Hölzer, 1996, unpublished.
8. E. Erola, V. Eteläniemi, P. Suorti, J. Appl. Crystallogr. 23 (1990) 35.
9. M. Krisch, A. Freund, G. Marot, L. Zhang, Nucl. Instr. Meth. A 308 (1991) 378.
10. Higher orders of diffraction are included by using an effective interplanar spacing of d/n, where n denotes the diffraction order.
11. The possibility of combining an on-axis geometry with a fast-beam source has been brought to my attention by R.D. Deslattes.
12. L.T. Hudson, R.D. Deslattes, A. Henins, C.T. Chantier, E.G. Kessler, J.E. Schweppe, Med. Phys. 23 (1996) 1659.
13. C.T. Chantler, R.D. Deslattes, A. Henins, L.T. Hudson, Br. J. Radiol. 69 (1996) 636.
14. The MacRay program package is available, on request, from the author.
15. B.W. Batterman, H. Cole, Rev. Mod. Phys. 36 (1964) 681.
16. W.H. Zachariasen, Theory of X-ray Diffraction in Crystals, Dover, NewYork, 1945.
17. See, for instance, S. Brennan, P.L. Cowan, Rev. Sci. Instr. 63 (1992) 850 and references cited therein.
18. Mathematica™ and MathLink™ are trademarks of Wolfram Research Inc.