A quantitative model to evaluate the ion-enrichment and ion-depletion effect at microchannel-nanochannel junctions

Analytica Chimica Acta

Volumn 650, Issue 2, 2009, Pages 214-220

  Li, Guanbin ^a   Wang, Shili ^a   Byun, Chang Kyu ^b   Wang, Xiayan ^a   Liu, Shaorong ^a  

^a UNIVERSITY OF OKLAHOMA   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

Author keywords

Electric double layers; Ion enrichment and ion depletion; Microchannel nanochannel junctions; Model; Zeta potential

Indexed keywords

COUNTERIONS; DEPLETION EFFECTS; ELECTRIC DOUBLE LAYER; ELECTRIC DOUBLE LAYERS; ELECTRIC FIELD STRENGTH; ELECTROOSMOTIC FLOW; ELECTROPHORETIC MIGRATION; FLUIDIC CHANNELS; MEASURED DATA; NANO CHANNELS; NANO-METER-SCALE; NET CHARGES; QUANTITATIVE MODELS; THEORETICAL MODELS;

ELECTRIC FIELDS; ELECTROCHEMISTRY; ELECTROOSMOSIS; MICROCHANNELS; NANOFLUIDICS; ZETA POTENTIAL;

IONS;

NANOCHANNEL;

ARTICLE; CONTROLLED STUDY; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD; ELECTROOSMOSIS; ELECTROPHORESIS; FLOW KINETICS; ION DEPLETION; ION ENRICHMENT; MOLECULAR DYNAMICS; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; THEORETICAL MODEL; ZETA POTENTIAL;

EID: 69249138653     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2009.07.044     Document Type: Article

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