Effect of substrate temperature on structural properties of thermally evaporated CdSe thin films of different thickness

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 2, Issue 6, 2008, Pages 342-348

  Borah, Mothura N ^a   Chaliha, S ^b   Sarmah, P C ^c   Rahman, A ^d  

^a Department of Physics   (India)

^b Bahona College   (India)

^c REGIONAL RESEARCH LABORATORY   (India)

^d GAUHATI UNIVERSITY   (India)

Author keywords

CdSe; Polycrystalline thin film; Structural parameters; Substrate temperature; Thickness

Indexed keywords

CADMIUM COMPOUNDS; DEPOSITION; ENERGY GAP; FILM THICKNESS; GRAIN SIZE AND SHAPE; II-VI SEMICONDUCTORS; LATTICE CONSTANTS; NARROW BAND GAP SEMICONDUCTORS; SELENIUM COMPOUNDS; STRUCTURAL PROPERTIES; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION;

CDSE; POLYCRYSTALLINE THIN FILM; STRUCTURAL PARAMETER; SUBSTRATE TEMPERATURE; THICKNESS;

FILM PREPARATION;

EID: 69249130146     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

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