Structural heterogeneity in chalcogenide glass films prepared by thermal evaporation

Journal of Non-Crystalline Solids

Volumn 353, Issue 18-21, 2007, Pages 2066-2068

  Almeida, Rui M ^a   Santos, Luís F ^a   Simens, Amanda ^b   Ganjoo, Ashtosh ^b   Jain, Himanshu ^b  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b Lehigh University   (United States)

Author keywords

Atomic force and scanning tunneling microscopy; Chalcogenides; Scanning electron microscopy; Vapor phase deposition

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHALCOGENIDES; GERMANIUM COMPOUNDS; GLASS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SURFACE MORPHOLOGY; THERMAL EVAPORATION; VAPOR DEPOSITION;

CHALCOGENIDE GLASS FILMS; HETEROGENEITIES;

THIN FILMS;

EID: 34247857601     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.02.044     Document Type: Article

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