Charged particle-display

Journal of Applied Physics

Volumn 106, Issue 3, 2009, Pages

  Cho, Sung Nae ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL ELECTRODE; GRAY SCALE; INTER-PARTICLE SPACING; LIGHT INTENSITY;

LIGHT SOURCES; LIGHT TRANSMISSION;

CHARGED PARTICLES;

EID: 69149107208     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3176485     Document Type: Article

References (32)

1. I. Ota, U.S. Patent No. 3669106 (June 1976).
2. N. Sheridon, U.S. Patent No. 4126854 (21 November 1978).
3. J. Jacobson and H. Yoshizawa, U.S. Patent No. 6241921 (5 June 2001).
4. J. Ding, C. Liao, S. Jeng, Y. Chen, and C. Lu, U.S. Patent No. 20060087490 (27 April 2006).
5. H. Mizuno, U.S. Patent No. 7023609 (4 April 2006).
6. H. Matsuda, U.S. Patent No. 20070109622 (17 May 2007).
7. B. Comiskey, J. Albert, H. Yoshizawa, and J. Jacobson, Nature (London) 0028-0836 394, 253 (1998). 10.1038/28349 (Pubitemid 28335031)
8. T. Whitesides, M. Walls, R. Paolini, S. Sohn, H. Gates, M. McCreary, and J. Jacobson, SID Int. Symp. Digest 0003-966X, 35, 133 (2004). 10.1889/1.1825759
9. T. Kosc, Opt. Photonics News 1047-6938 16, 18 (2005). 10.1364/OPN.16.2.000018 (Pubitemid 40303195)
10. R. Sakurai, H. Hiraoka, T. Kobayashi, H. Yamazaki, and H. Kitano, U.S. Patent No. 0174854 (24 July 2008).
11. R. Hattori, S. Yamada, Y. Masuda, and N. Nihei, J. Soc. Inf. Disp. 1071-0922 12, 75 (2004). 10.1889/1.1824242
12. R. Hattori, S. Yamada, Y. Masuda, N. Nihei, and R. Sakurai, J. Soc. Inf. Disp. 1071-0922 12, 405 (2004). 10.1889/1.1847739 (Pubitemid 40010197)
13. R. Hattori, S. Yamada, Y. Masuda, N. Nihei, and R. Sakurai, SID Int. Symp. Digest 0003-966X 35, 136 (2004). 10.1889/1.1825765
14. S. Kwon, S. Lee, W. Cho, B. Ryu, and M. Song, SID Int. Symp. Digest 0003-966X 37, 1838 (2006). 10.1889/1.2433400
15. S. Johnson, Stephen Johnson on Digital Photography (O'Reilly Media, Sebastopol, CA, 2006).
16. S. Kaneko, M. Asakawa, R. Hattori, Y. Masuda, N. Nihei, A. Yokoo, and S. Yamada, Proceedings of the International Display Workshops 08, 2008, pp. 1267-1270.
17. M. Nishii, R. Sakurai, K. Tanaka, S. Ohno, S. Tsuchida, Y. Masuda, I. Tanuma, and R. Hattori, Proceedings of the SID 08 Digest, 2008, pp. 1819-1822.
18. R. Hattori, S. Yamada, Y. Masuda, and N. Nihei, Proceedings of the SID 03 Digest, 2004, pp. 846-849.
19. W. Chim, " A Flexible Electronic Paper with Integrated Display Driver using Single Grain TFT Technology.," M.S. thesis, Computer Engineering, Deptartment of Electrical Engineering, Delft University of Technology (2009).
20. S. Cho, Korean Patent No. 10-2008-0105475 (2008).
21. C. Bohren and D. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1998).
22. P. Stoller, V. Jacobsen, and V. Sandoghdar, Opt. Lett. 0146-9592 31, 2474 (2006). 10.1364/OL.31.002474 (Pubitemid 44517665)
23. P. Johnson and R. Christy, Phys. Rev. B 0163-1829 6, 4370 (1972). 10.1103/PhysRevB.6.4370
24. R. DeRosa, P. Schader, and J. Shelby, J. Non-Cryst. Solids 0022-3093 331, 32 (2003). 10.1016/j.jnoncrysol.2003.08.078
25. Y. Shin, D. Lee, K. Lee, K. Ahn, and B. Kim, J. Ind. Eng. Chem. (Seoul, Repub. Korea) 1226-086X 14, 515 (2008).
26. B. Alince and R. Tino, Colloids Surf., A 0927-7757 218, 1 (2003). 10.1016/S0927-7757(02)00591-5 (Pubitemid 36603386)
27. H. Miyake, Y. Tanaka, T. Takada, and R. Liu, Proceedings of 2005 International Symposium on Electrical Insulating Materials, Kitakyushu, Japan, 2005, Vol. 1, pp. 49-52.
28. H. Miyake, Y. Tanaka, and T. Takada, IEEE Trans. Dielectr. Electr. Insul. 1070-9878 14, 520 (2007). 10.1109/TDEI.2007.344634 (Pubitemid 46574017)
29. F. Reif, Fundamentals of Statistical and Thermal Physics (McGraw-Hill, New York, 1965).
30. G. Thomas and R. Finney, Calculus and Analytic Geometry, 7th ed. (Addison-Wesley, USA, 1988).
31. S. Szirmai, Industry Applications Conference, 2000, Conference Record of the 2000 IEEE, Rome, Italy, 2000, Vol. 2, pp. 851-857.
32. I. Cho, T. Song, S. Baek, and E. Yoon, Proceedings of the 18th IEEE International Conference on Micro Electro Mechanical Systems, 2005, pp. 32-35.