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Volumn 355, Issue 37-42, 2009, Pages 1849-1852

Surface pattern recording in amorphous chalcogenide layers

Author keywords

Amorphous films; Electron microscopy; Optical properties

Indexed keywords

AMORPHOUS CHALCOGENIDE; ELECTRON BEAM RECORDING; INTER-DIFFUSION; LAYERED STRUCTURES; RADIATION INDUCED DEFECTS; SURFACE PATTERN; THERMAL PROCESS; VOLUME EXPANSION;

EID: 69149105134     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.06.043     Document Type: Article
Times cited : (7)

References (16)
  • 13
    • 34250679310 scopus 로고    scopus 로고
    • Drouin D., et al. Scanning 29 3 (2007) 92
    • (2007) Scanning , vol.29 , Issue.3 , pp. 92
    • Drouin, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.