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Volumn 355, Issue 37-42, 2009, Pages 1849-1852
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Surface pattern recording in amorphous chalcogenide layers
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Author keywords
Amorphous films; Electron microscopy; Optical properties
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Indexed keywords
AMORPHOUS CHALCOGENIDE;
ELECTRON BEAM RECORDING;
INTER-DIFFUSION;
LAYERED STRUCTURES;
RADIATION INDUCED DEFECTS;
SURFACE PATTERN;
THERMAL PROCESS;
VOLUME EXPANSION;
INTEGRATED OPTOELECTRONICS;
LIGHT TRANSMISSION;
OPTICAL GLASS;
OPTICAL MICROSCOPY;
OPTICAL PROPERTIES;
TEXTILE PRINTING;
AMORPHOUS FILMS;
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EID: 69149105134
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2009.06.043 Document Type: Article |
Times cited : (7)
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References (16)
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